Optimized generation of VHDL mutants for injection of transitionerrors

摘要

Fault injection in VHDL descriptions has become an efficientsolution to analyze at an early stage of the design the potential faultybehaviors of a complex digital circuit. Such injections may use eithersaboteurs or mutants. In this paper, the focus is placed on“controlled generation” of mutants, which means that thegeneration of mutants is (1) done for precise fault/error models relatedto faults occurring in the field and (2) optimized for synthesis ontoemulation hardware. Several approaches are proposed to inject transitionerrors in FSMs or RT-level control flowcharts. These approaches arecompared and the results show the impact of the mutant generation on theresult efficiency