A contribution to testing of analog integrated circuits in the DCdomain

摘要

A test method for analog circuits is presented which is based uponsimple DC measurements that can be performed directly on the wafer. Themethod handles parameters at various levels, e.g. process, device andcircuit parameters. In contrast to other methods that use parameterintervals, the method described obtains a mathematical relation betweenthe parameters, which results in a more powerful decision criterion. Themethod may be used as the basis for automatic testing