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Numerical and experimental investigations of large IC flip chipattach

机译:大型IC倒装芯片的数值和实验研究连接

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Because flip chips can achieve high electrical interconnect speed,high density, and low profiles, a team from the Fraunhofer Institute forReliability and Microintegration in Berlin and from Georgia Techundertake a study examining the extreme limits of flip chip input/output(I/O) capabilities and physical dimensions. Their starting point is aSIA estimate of memory requirements, based on Moore's Law, for the year2012. In order to study the limitations of flip chip technology thegroups are working on both, advanced thermomechanical simulation andhands-on interconnection technology resulting in the design of four flipchips. They have the dimensions of 10×10 mm2,20×20 mm2, 30×30 mm2, and 40×40mm2. With these designs both, the simulation and theinterconnection technology departments of Fraunhofer IZM start toevaluate the feasibility of flip chips beyond 20×20 mm2
机译:由于倒装芯片可以实现较高的电气互连速度, 弗劳恩霍夫研究所(Fraunhofer Institute)的团队 柏林和佐治亚理工学院的可靠性和微集成 进行研究以检查倒装芯片输入/输出的极限 (I / O)功能和物理尺寸。他们的出发点是 SIA根据摩尔定律对当年的内存需求进行估算 2012年。为了研究倒装芯片技术的局限性, 小组正在同时进行高级热力学模拟和 动手互连技术实现了四层翻转的设计 筹码。它们的尺寸为10×10 mm 2 , 20×20 mm 2 ,30×30 mm 2 和40×40 mm 2 。通过这些设计,仿真和仿真 Fraunhofer IZM的互连技术部门开始 评估超过20×20 mm 2 的倒装芯片的可行性

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