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Error Correction in Variable-Temperature Characterization of Material Complex Dielectric Spectrum

机译:材料复介电谱的变温表征中的误差校正

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We present a method for temperature-dependent calibration of a multichannel measurement system for 0.05-3 GHz characterization of material complex dielectric-spectrum. This system, described elsewhere, is based on one-port vector-network-analyzer measurements of a two-port coaxial-cell terminated with a variable load. The nominal system calibration uses multiple coaxial transmission-line sections terminated with a variable termination, and due to a large number of calibration standards is difficult to implement in a multichannel system at multiple temperatures. Therefore, we devised a new variable-temperature calibration approach. In this approach we assume that the temperature variation causes only small changes of the system calibration coefficients, and determine those changes with an approximate calibration technique requiring a lower number of calibration standards. We verify our approach based on measurements of PTFE samples at temperatures from 0 to 40 degrees Celsius.
机译:我们提出了一种基于温度的多通道测量系统的标定方法,用于材料复杂介电谱的0.05-3 GHz表征。在别处描述的该系统基于以可变负载终止的两端口同轴单元的单端口矢量网络分析仪测量。标称系统校准使用端接可变终端的多个同轴传输线部分,并且由于存在大量校准标准,因此难以在多温度下的多通道系统中实施。因此,我们设计了一种新的可变温度校准方法。在这种方法中,我们假设温度变化仅引起系统校准系数的很小变化,并使用需要较少数量校准标准的近似校准技术来确定这些变化。我们基于在0到40摄氏度的温度下对PTFE样品的测量来验证我们的方法。

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