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Investigating Electronical Contact Loss Between LIB Cathode Particles by ICP-OES

机译:通过ICP-OES研究LIB阴极颗粒之间的电子接触损耗

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Mechanical degradation phenomena occurring during charging and discharging can severely affect the electronical contact among the particles within the composite cathode material (e.g. LiNi[1/3]Mn[1/3]Co[1/3]O[2] (NMC111)). In particular, the application of high C-rates results in mechanical strain facilitating the disintegration of active material particles from the conductive network and therefore leading to a deterioration of the electrochemical performance.There is a large variety of monitoring and investigation techniques for the analysis of electrode materials (e.g. impedance spectroscopy, X-Ray Diffraction, Raman spectroscopy). These techniques provide mean values of certain fractions of the bulk or surface material. However, the analysis of electronical contact loss requires investigations on particle level. Therefore, the development of novel analytical approaches for the investigation of particle contact loss and the resulting contribution on the capacity fading is mandatory. The focus of this work is the development of a method for single particle analysis of lithium ion battery (LIB) cathode materials by means of inductively coupled plasma optical emission spectroscopy (ICP-OES). For this application, ICP-OES outweighs other techniques due to the elemental specificity, selectivity and a simultaneous detection of several analytes.Presuming an intact conductive network within the electrode, the state of charge (SOC) of every active material particle should be equal. Since the SOC correlates with the degree of lithiation (DOL) of the particles, the assessment of electronical contact is accessible by determining the ratio of lithium and host element (e.g. nickel, cobalt, manganese) on a particle level by ICP-OES.
机译:在充电和放电过程中发生的机械降解现象会严重影响复合阴极材料(例如LiNi1 / 3 / Mn1 / 3 / Co1 / 3 / O [2](NMC111))中的颗粒之间的电子接触。 。特别是,高C速率的应用会导致机械应变,从而促进活性材料颗粒从导电网络中分解,从而导致电化学性能下降。电极材料(例如,阻抗光谱,X射线衍射,拉曼光谱)。这些技术提供了块状或表面材料的某些部分的平均值。但是,电子接触损耗的分析需要对颗粒水平进行研究。因此,必须开发新颖的分析方法来研究颗粒的接触损耗及其对容量衰减的贡献。这项工作的重点是开发一种通过电感耦合等离子体发射光谱(ICP-OES)对锂离子电池(LIB)阴极材料进行单颗粒分析的方法。对于此应用,ICP-OES的元素特异性,选择性和多种分析物的同时检测能力胜过其他技术。假设电极内有完整的导电网络,则每个活性物质颗粒的电荷状态(SOC)应相等。由于SOC与颗粒的锂化程度(DOL)相关,因此可以通过ICP-OES确定颗粒水平上锂与主体元素(例如镍,钴,锰)的比例来进行电子接触评估。

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