High Efficiency and Low Overkill Testing for Probabilistic Circuits

摘要

Probabilistic circuits are a potential solution for low power designs which trade off correctness for power consumption. The behavior of probabilistic circuits are more complicated than deterministic circuits because the former produce different outputs given the same inputs. We need to apply test pattern many times to obtain output distribution of probabilistic circuits. In this paper, we apply multivariate hypothesis testing to reduce pattern repetition. We also reduce overkill by tomographic testing to determine pass or fail of CUT. Experimental results show that our proposed technique can reduce pattern repetition by 82% and reduce overkill by 99%.