A Reliable Near-Threshold Voltage SRAM-Based PUF Utilizing Weight Detection Technique

摘要

With the continuous advancement of technology, security issues have become increasingly important. In the applications of Internet of Things (IoT), millions of IoT devices are designed to collect data that are sensitive or private. It is crucial to secure such devices. Therefore, every vulnerable device needs to be protected during either communication or operation. Physical unclonable function (PUF), which utilizes random variation during the chip manufacturing process, can realize the concept of chip fingerprint. A PUF not only enhances security but also provides a lightweight choice different from the traditional mechanism that requires a huge amount of storage. In this paper, a reliable near-threshold voltage SRAM-based PUF is designed and presented. The proposed near-threshold design not only achieves 98.055% reliability and 49.99% uniqueness but also consumes lower energy when compared with other works.