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AI Powered THz Testing Technology for Ensuring Hardware Cybersecurity

机译:AI供电的太赫兹测试技术可确保硬件网络安全

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摘要

We report on a novel non-destructive testing method for integrated circuits (ICs) by measuring their response to scanning terahertz and sub-terahertz radiation at the pins. Analyzing the response using artificial intelligence (AI), counterfeit, altered, or damaged ICs can be identified as in-package and in-situ.
机译:我们通过测量引脚对扫描太赫兹和次太赫兹辐射的响应,报告了一种针对集成电路(IC)的新型无损测试方法。使用人工智能(AI)分析伪造,更改或损坏的IC的响应可以识别为包装内和原位。

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