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Multiple Criteria Optimization of Radio-Electronic Structures Based on Interval Deviation Analysis of Design Parameters in Heterogeneous Measuring Scales

机译:基于异质测量尺度中设计参数间隔偏差分析的无线电电子结构多准则优化

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A technique for multiple criteria choice of the preferred design solution is considered at the stages of testing prototypes for radio-electronic systems, when measured and controlled design parameters deviate from the values of the specification. Some of parameters and quality indicators of technical specifications may initially not have clear values, and they are refined in the process of subsequent design stages. It is difficult for designers to objectively compare improvement in the value of a certain criterion with deterioration in the value of another criterion. Thus, it is proposed to use an integrated application of decision making theory methods, the theory of fuzzy sets, and interval analysis methods. The proposed method takes into account deviation of measuring information of the designed system and various types of uncertainty associated with heterogeneity of the parameters and their measurement scales. Optimization of design decisions by a heterogeneous vector of quality criteria involves applying values of membership functions, showing the degree of proximity of the implementation option of the design solution to the optimal option, instead of coefficients that take into account the importance of the criteria. The technique allows obtaining a solution to the problem of choosing the optimal design of electronic systems according to the results of the analysis of measurement information more reasonably and at low cost, as well as reducing the number of repeated design stages, time, and financial costs for research and development activities.
机译:当测量和受控设计参数偏离规范值的测量和受控设计参数时,考虑了用于多个标准选择优选设计解决方案的标准选择优选设计解决方案的选择。技术规范的一些参数和质量指标可能最初没有明确的值,并且它们在后续设计阶段的过程中被精制。设计师难以客观地比较某种标准的价值的改进,并在另一标准的值下恶化。因此,建议使用决策理论方法的综合应用,模糊集的理论和间隔分析方法。所提出的方法考虑了设计系统的测量信息的偏差和与参数的异质性相关的各种类型的不确定性及其测量尺度。通过异构载体的异构矢量优化设计决策涉及应用隶属函数的价值,显示设计方案对最佳选项的实现选项的接近程度,而不是考虑标准的重要性的系数。该技术允许在更合理地和低成本的情况下,获得根据测量信息分析的结果选择电子系统的最佳设计的解决方案,以及减少重复设计阶段,时间和金融成本的数量用于研发活动。

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