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Analysis of Self Checking and Self Resetting Logic in CLA and CSA Circuits Using Gate Diffusion Input Technique

机译:使用门扩散输入技术分析CLA和CSA电路中的自检和自复位逻辑

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This paper evaluates the performance of the gate diffusion input technique (GDI) on self-checking and self-resetting logic (SRL) GDI technique of carry select adder (CSA) and carry look-ahead adder (CLA) for different word lengths. In the proposed design adapting level restoration technique eliminates conductance overlap between n-MOS and p-MOS devices. The various self-resetting logic implementations for self-correcting of carry select adder and carry look-ahead adder can detect all single stuck faults in normal operation mode. Besides, two rail encoding technique is used in carry select adder are used for multiple error detection/correction. The SRLGDI setup consists of a pair of full adders, multiplexers, two rail checking, and self-resetting logic. In this technique, the self-checking carry select adder is used for reducing area and self-resetting improves the performance of the adder. The analysis of CSA and CLA with 180nm technology is simulated by using Cadence tools. The delay reduction is 12.836% for 8-bit CLA using SRL GDI, power reduction is 27.55% for 8-bit CSA using SRL-GDI compared to the gate diffusion input technique. This GDI technique implementation saves the average energy consumption up to 31.14% in CSA and 32.83% in CLA making it suitable for power optimization in high speed VLSI systems.
机译:本文评估了门扩散输入技术(GDI)在进位选择加法器(CSA)和进位超前加法器(CLA)对于不同字长的自检和自复位逻辑(SRL)GDI技术上的性能。在提出的设计中,自适应电平恢复技术消除了n-MOS和p-MOS器件之间的电导重叠。用于进位选择加法器和进位超前加法器的自校正的各种自复位逻辑实现可以在正常操作模式下检测所有单个卡住的故障。此外,进位选择加法器中使用了两种轨编码技术来进行多重检错/纠错。 SRLGDI设置包括一对完整的加法器,多路复用器,两个导轨检查和自复位逻辑。在该技术中,自检进位选择加法器用于减小面积,并且自复位提高了加法器的性能。使用Cadence工具模拟了使用180nm技术对CSA和CLA进行的分析。与门扩散输入技术相比,使用SRL GDI的8位CLA的延迟降低为12.836%,对于使用SRL-GDI的8位CSA的功率降低为27.55%。这种GDI技术实现可将CSA中的平均能耗节省多达31.14%,将CLA中的能耗平均节省了32.83%,使其适用于高速VLSI系统中的功耗优化。

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