A New Method for Determining Permittivity of Materials Using Waveguides with Complex Cross Sections

摘要

A new broadband method is proposed for measuring the complex permittivity of materials in C-, X- and Cu-bands. It is proposed to use waveguides with complex cross sections as measuring cells. A new technique has been developed for unambiguously determining the phase of electromagnetic waves in waveguides. Methods for measuring the real and imaginary parts of the complex permittivity are presented. Determination of the parameters of the reference sample made of Teflon has been carried out. The agreement of the measurements results with references is shown.