METHOD DETERMINING HIGH VALUES OF COMPLEX DIELECTRIC PERMITTIVITY OF IMPEDANCE MATERIALS

摘要

FIELD: measurement technology. SUBSTANCE: method deals with radio measurement of parameters of SHF absorbing materials, specifically, to measurement of complex dielectric permittivity and loss tangent of dielectric in composite materials of carbon plastic type. Method includes measurement of roughness of surface of measured specimen of material, selection of reference shorting device of same roughness as measured material, measurement of complex reflection factor of reference shorting device and measured specimen and processing of measurement results with computation of values of complex dielectric permittivity and loss tangent of dielectric material. EFFECT: increased accuracy of measuring of phase reflection factor of composite materials of carbon plastic type with rough surfaces. 2 dwg