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Common-Centroid Layouts for Analog Circuits: Advantages and Limitations

机译:模拟电路的常见质心布局:优点和限制

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Common-centroid (CC) layouts are widely used in analog design to make circuits resilient to variations by matching device characteristics. However, CC layout may involve increased routing complexity and higher parasitics than other alternative layout schemes. This paper critically analyzes the fundamental assumptions behind the use of common-centroid layouts, incorporating considerations related to systematic and random variations as well as the performance impact of common-centroid layout. Based on this study, conclusions are drawn on when CC layout styles can reduce variation, improve performance (even if they do not reduce variation), and when non-CC layouts are preferable.
机译:常见的质心(CC)布局广泛用于模拟设计,以使电路通过匹配装置特性来改变变化。 然而,CC布局可能涉及比其他替代布局方案增加的路由复杂性和更高的寄生。 本文重点分析了使用常见质心布局的使用背后的基本假设,包括与系统和随机变化相关的考虑,以及共用质心布局的性能影响。 基于这项研究,当CC布局风格可以减少变化时,提高了结论,提高性能(即使它们不降低变化),当非CC布局是优选的。

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