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High Operating Temperature MCT Discrete Detector Data and Analysis

机译:高工作温度MCT离散检测器数据和分析

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High Density Vertically Integrated Photodiodes (HDVIP) MWIR detectors were fabricated in LPE-grown Mercury Cadmium Telluride material. Devices were fabricated with two different acceptor level concentrations. The low doped n-region was held at a single concentration but the dimensions are tailored to simultaneously maintain high quantum efficiency while minimizing dark current and 1/f noise. Since this study target was for operating at high temperatures, detector Ⅰ-Ⅴ data was collected between 120 K and 280 K for I-Vs and 180 to 280 K for noise to understand current mechanisms that limit device performance at these elevated temperatures. Noise as a function of frequency has also been collected over the same temperature range. 1/f noise has also been modeled for MWIR detectors as a function of temperature and will be covered.
机译:高密度垂直集成光电二极管(HDVIP)MWIR检测器是由LPE生长的碲化汞镉材料制成的。用两种不同的受体水平浓度制造器件。低掺杂n区域保持单一浓度,但尺寸经过了调整,可同时保持高量子效率,同时将暗电流和1 / f噪声降至最低。由于该研究目标是在高温下工作,因此对于I-Vs,在120 K至280 K之间收集了探测器Ⅰ-Ⅴ数据,对于噪声则收集了180至280 K之间的探测器Ⅰ-Ⅴ数据,以了解限制这些高温条件下器件性能的电流机理。在相同的温度范围内,还收集了噪声与频率的关系。 1 / f噪声也已针对MWIR检测器建模为温度的函数,将被涵盖。

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