Polarization-resolved quantification of bulk and surface contributions to second-harmonic generation in AIGaAs

摘要

We demonstrate that bulk and surface contribution to the second-harmonic generation (SHG) in semiconductor material AIGaAs can be efficiently separated by the polarization-resolved determination of second-harmonic signal from plane layer of AIGaAs when illuminated by the tightly-focused linearly-polarized Gaussian beam. Introduction.