Interferometric measurements of phase objects by using a simultaneous polarizing phase shifting Mach-Zehnder interferometer

摘要

In this research an interferometric system was developed that generates four simultaneous interferograms with independent phase shifts using modulated polarization. The proposed system consists of three coupled interferometers: the first system is a polarized Mach-Zehnder interferometer, which generates the pattern, the second and the third interferometer system, function as replicators of the first pattern, so the four patterns are generated. To show the novelty of the developed system, the calculation of optical path difference (OPD) for phase samples are shown.