Magnetic particle inspection (MPI) is widely used for aerospace applications with inspection development essentially limited to empirical knowledge and experience-based approaches [1,2]. Present results show that the sensitivity of magnetic particle inspection, which is a variant of the Bitter technique, does not necessarily increase with defect size. Better quantitative understanding of the MPI technique and factors that affect its sensitivity and reliability contribute not only to reductions in inspection design cost and time but also improvement of analysis of experimental data. Computational advances have enabled the numerical simulations of MPI for a complicated geometry. In this paper we report a sensitivity analysis of numerical simulations of MPI for defects with various sizes using the finite clement method (FEM).
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