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INVESTIGATIONS ON THE STRAY-FIELDS OF MAGNETIC READ/WRITE HEADS AND THEIR STRUCTURAL REASONS

机译:磁读/写头杂散场的研究及其结构原因

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For the development of increased density of data storage in magnetic recording, it is very important to produce highly efficient magnetic heads with an optimized head design for the read/write purposes. To prove design parameters, it is necessary to exactly evaluate the magnetic stray-fields and to detect possible flux leaks in model heads. Our model heads are a Ferrite read head and a MIG (metal-in-gap) write head. The investigations are carried out in electron microscopes, which are equipped with a special lens for magnetic field-free imaging. Qualitative examinations of the stray-field were carried out in Foucault technique on a Philips CM30. A quantitative measurement could be achieved usind the DPC-technique [1] (differential phase contrast) in a JEOL 2000 FX with a special 4-quadrant-detector. From the collected DPC data sets a 3D reconstruction of the stray-field, based on the Algebraic Reconstruction Technique [2] or the Radon Tranform Method [3] was possible. In parallel, for the MIG-heads TEM observations of the interface region between the Ferrite material and the metal coating were carried out. From these investigations the following results could be gained: (1) From linescans (taken at about 0.5 μm from the poletip surface, see fig. 1) it is obvious that the stray-field of the MIG head is more localized and shows a higher overall maximum compared to the Ferrite head. A tomographic field reconstruction has been performed to obtain the 3D character of the stray-field of the Ferrite-head at about 0.25-0.375 μm from the poletip surface. From this reconstruction, the extent and strength of the 3D stray-field can be seen directly. (2) From a "BH"-loop, acquired at the center of the polegap of the MIG-head it can be seen (fig.2), that up to approximately 25 mA of driving current a steady increase of the strength of the stray-field is achievable. For currents higher than 25 mA, the strength of the stray-field remains constant. For the MIG head additional stray-fields (secondary gaps) at the Ferrite-softmagnetic interface can clearly be observed. (3) From TEM investigations of the Ferrite/metal interface region in MIG-heads, an insufficient match between the structures was found, which leads to a weak magnetic coupling and generates the observed "secondary gaps". This explains the unsatisfactory electrical response properties. The magnetic and structural matching can be improved by using a thin functional film between the two materials.
机译:为了开发磁记录中数据存储的增加的密度,对于产生高效的磁头,具有优化的头部设计,对于读/写目的,非常重要。为了证明设计参数,有必要精确评估磁场场和模型头中可能的磁通量泄漏。我们的模型头是铁氧体读头和MIG(金属间隙)写头。研究在电子显微镜下进行,其配备有磁场无磁场的特殊镜头。在飞利浦CM30上的FOOCAULT技术中进行了对流场的定性检查。通过特殊的4象限检测器将DPC技术[1](差分相位对比)在JEOL 2000 FX中取消定量测量。从收集的DPC数据设置杂散场的3D重建,基于代数重建技术[2]或氡变平面方法[3]是可能的。并行地,对于铁氧体材料和金属涂层之间的界面区域的MIG-HEAD TEM观察。从这些调查中可以获得以下结果:(1)从线路(距从折凸表面约0.5μm,见图1)很明显,MIG头的杂散场更为局限并显示出更高的与铁氧体头相比总体最大值。已经执行了间断场重建,以从旋脂表面获得约0.25-0.375μm的铁氧体头的杂散场的三维特征。从这种重建,可以直接看到3D流场的范围和强度。 (2)从“BH” - 在MIG头的POLEGAP中心获得它可以看出(图2),直到大约25 mA的驱动电流稳步增加的力量流浪场是可实现的。对于高于25 mA的电流,杂散场的强度保持恒定。对于MIG头部可以清楚地观察到铁氧体 - 软磁性界面处的额外杂散场(次要间隙)。 (3)从MIG头中的铁氧体/金属界面区域的TEM调查,发现结构之间的匹配不足,这导致弱磁耦合并产生观察到的“二次间隙”。这解释了不令人满意的电气响应属性。通过在两种材料之间使用薄的功能膜可以改善磁性和结构匹配。

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