MICROSTRUCTURE/MAGNETIC PROPERTY RELATIONSHIPS IN CoCrPt/Cr MAGNETIC THIN FILMS

摘要

One of the most significant problems in high density magnetic recording is the noise associated with magnetic exchange coupling between grains located at domain transition regions[1]. However, a significant decrease in noise has been found to occur as a result of alloying Co with large concentrations of Cr[2]. While exploring this phenomenon, we discovered that by treating the NiP-plated Al substrates prior to deposition the coercivity of the media increased relative to samples grown on untreated substrates. Furthermore, x-ray diffraction scans of the treated samples exhibited a broader Cr [200] peak than those of the untreated samples. These results motivated the use of TEM analysis in an attempt to relate the microstructural characteristics of the films to the observed magnetic properties and x-ray data.