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Development of a surface alpha ray detector based on μ-TPC with low background

机译:基于μ-TPC的低背景表面α射线探测器的研制

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Radioactive impurities in the detector material have been focused as the serious background in a search for a dark matter. In order to select a pure material which have a low radioactive impurity such as nuclear in uranium-chain and thorium-chain, a precise measurement of radioactivity has been required. A new alpha-ray detector has been developed based on a gaseous μ-TPC. A low-α μ-PIC was installed to the detector for low background measurement. The detector has advantages of a position sensitivity and a ability to take sample and background event on a same time. We performed to calibrate the energy, to evaluate resolution using an alpha-ray source, to inspect a sample as a part of a conventional μ-PIC as a demonstration.
机译:检测器材料中的放射性杂质已成为寻找暗物质的重要背景。为了选择具有低放射性杂质(例如铀链和or链中的核)的纯净材料,需要精确测量放射性。基于气态μ-TPC的新型α射线探测器已经开发出来。将低αμ-PIC安装到检测器上以进行低背景测量。该检测器的优点是位置灵敏度高,并且可以同时进行采样和背景事件。我们进行了校准能量,使用alpha射线源评估分辨率,作为常规μ-PIC一部分检查样品的演示。

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