【24h】

X-band GaAs RF Power Amplifier Thermo Mode Research

机译:X波段GaAs射频功率放大器热模式研究

获取原文

摘要

Important parameter of high power RF integrated circuits (IC) is a high density of heat generation elements on die. It causes extremely overheating HEMT active regions, parameters, and lifetime degradation. It's important to determine to die maximum temperature as a function of timing. The research of thermo heating mode for 10W X-band GaAs RF high power amplifier was done. Scientific software and infrared SC5700 camera were used. It was shown that output stage transistors are most critical in terms of thermal mode. The paper contains maximum die temperature and output RF power as a function of the power supply duty cycle. It was shown that the duty cycle increasing from 5% to 15% causes the die temperature increasing on 30C and output RF power decreasing on 20%. Output transistors maximum temperature as a function of power supply pulse width (with a constant duty cycle) have determined. It was shown that power pulse width increasing from 25 μs to 150 μs causes die overheating on 10 - 15C and output RF power decreasing on 8 - 10%. Experimental results show good agreement with computer simulation [1]-[3].
机译:高功率射频集成电路(IC)的重要参数是芯片上发热元件的高密度。它会导致HEMT有源区,参数极端过热,并降低使用寿命。确定随时间变化的最高温度非常重要。对10W X波段GaAs RF大功率放大器的热加热模式进行了研究。使用了科学软件和红外SC5700摄像机。结果表明,输出级晶体管在热模式方面最为关键。本文包含了最高芯片温度和输出RF功率随电源占空比变化的关系。结果表明,占空比从5%增加到15%会导致芯片温度在30C时升高,而输出RF功率在20%时降低。确定了输出晶体管的最高温度与电源脉冲宽度(恒定占空比)的关系。结果表明,功率脉冲宽度从25μs增加到150μs会导致芯片在10-15C时过热,而输出RF功率下降8-10%。实验结果表明与计算机仿真[1]-[3]有很好的一致性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号