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Calibration of photo-detector's absolute spectral responsivity in the wavelength range 300 nm to 1000 nm

机译:在300 nm至1000 nm波长范围内校准光电探测器的绝对光谱响应度

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Various kinds of photo-detectors based on different materials have been successfully developed to expand the horizon of human eye. Spectral responsivity is the most important technical parameter for photo-detectors, which can mirror the converting ability of optical signal to electric current. Its measurement accuracy is critical for the development and research of photo-detecting field. In this paper, we will introduce the facility for photo-detector's spectral responsivity calibration in the wavelength range of 300 nm to 1000 nm, built in National Institute of Metrology (NIM), China. Measurement uncertainty is analyzed at the wavelength 500 nm as an example. By adopting comparison method, choosing reference detectors with known standard value and traceable to SI units through upper level standards, we demonstrated a reliable measurement procedure for absolute spectral responsivity of photo-detectors.
机译:已经成功地开发了基于不同材料的各种光电检测器,以扩大人眼的视野。光谱响应度是光电探测器最重要的技术参数,可以反映光信号到电流的转换能力。其测量精度对于光检测领域的发展和研究至关重要。在本文中,我们将介绍由中国国家计量学院(NIM)建造的,用于在300 nm至1000 nm波长范围内进行光探测器光谱响应率校准的设备。以波长为500 nm的测量不确定度为例进行分析。通过采用比较方法,选择标准值已知且可通过上级标准溯源至SI单位的参考检测器,我们展示了一种可靠的测量程序,可用于测量光电探测器的绝对光谱响应度。

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