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Overcoming interconnect scaling challenges using novel process and design solutions to improve both high-speed and low-power computing modes

机译:使用新颖的工艺和设计解决方案来克服互连扩展的挑战,从而改善高速和低功耗计算模式

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Interconnect scaling in future CMOS technology nodes is projected to cause an unprecedented increase in resistance, making interconnects the key performance limiter instead of transistors. Both high-speed and low-power computing modes based on dynamically changing VDD and frequency will be the most impacted by this trend. To overcome this dilemma we present device-circuit-architecture solutions based on the reconfiguration of i) buffered interconnects and ii) execution architecture. Interconnect is dynamically reconfigured by either CMOS transistors or novel Insulator-Metal-Transition “via” devices. Processor execution resources are dynamically re-provisioned based on operating mode and activity metrics. With projected interconnect resistance, a simulated processor design shows 18% and 15% performance improvement from interconnect and execution architecture reconfiguration, respectively. When combined, these techniques provide 35% performance improvement in high-speed mode and energy efficiency in low-power mode.
机译:预计未来CMOS技术节点中的互连缩放将导致电阻的空前增加,从而使互连成为关键的性能限制器,而不是晶体管。基于动态变化的VDD和频率的高速和低功耗计算模式都将受到这种趋势的最大影响。为了克服这个难题,我们提出了基于i)缓冲互连和ii)执行架构的重新配置的设备电路架构解决方案。互连可以通过CMOS晶体管或新型的绝缘体-金属过渡“通过”器件动态地重新配置。根据操作模式和活动指标动态重新配置处理器执行资源。利用预计的互连电阻,经过仿真的处理器设计显示,互连和执行体系结构重新配置分别将性能提高了18%和15%。结合使用这些技术,可以在高速模式下提高35%的性能,并在低功率模式下提高能效。

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