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Atomistic investigation of the electronic structure, thermal properties and conduction defects in Ge-rich GexSe1−xmaterials for selector applications

机译:选择器应用的富Ge的Ge x Se 1-x 材料的电子结构,热学性质和导电缺陷的原子学研究

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We investigate the electronic structure and defects of GexSe1-xmaterials at the atomic level, using full-layer-thickness (5nm) amorphous models. In Ge-rich GexSe1-x, the nature of the mobility gap defects is mostly related to miscoordinated Ge. The population/localization of mobility-gap states changes solely under the effect of electric field. Strong covalent bonds introduced by N doping in the material increase its thermal conductivity and crystallization temperature beyond 600C. C/N dopants are found to add/remove mobility-gap states in the doped systems. Our investigation sets guidelines for material design in view of improved electro-thermal device performance.
机译:我们研究锗的电子结构和缺陷 x 1-x 使用全层厚度(5nm)非晶模型的原子级材料。在葛富 x 1-x ,迁移率间隙缺陷的性质主要与Ge配位不当有关。迁移能隙状态的总体/局部仅在电场的作用下发生变化。 N掺杂在材料中引入的强共价键将其热导率和结晶温度提高到600℃以上。发现C / N掺杂剂在掺杂的系统中增加/去除了移动间隙状态。考虑到电热装置性能的提高,我们的调查为材料设计设定了指导原则。

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