Nonparametric variance control charts based on siegel-tukey test

摘要

To monitor the process variance in a distribution-free way is important, but relative research is still lack in the literature. We propose some new nonparametric control charts based on Siegel-Tukey test. The proposed charts can detect shifts in process variance, and the in-control performance will not be affected by the underlying process distribution. We compare the out-of-control performance to the parametric control charts and the results are convincing. We also give a numerical example to show how the charts work.