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Prediction of apple internal qualities using hyperspectral imaging techniques

机译:使用高光谱成像技术预测苹果的内部品质

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Sugar content and firmness are significant internal properties and have important significance for quality grade and industry production. The hyperspectral imaging techniques was investigated for prediction of sugar content and firmness in apples. Mean spectra were extracted from the regions of interest of the image between 400nm and 1000nm. After multiplicative scatter correction (MSC) preprocessing, the regression coefficient of partial least squares (PLS) was used to extract feature wavelengths. 6 feature wavelengths of sugar content (384.2, 418.9, 502.5, 675.2, 720.9, 968.7nm) and 6 feature wavelengths of firmness (418.9, 500.0, 513.5, 599.9, 704.4, 964.7nm) were extracted. The performance of prediction model of sugar content and firmness in full wavelength and feature wavelength was compared, 3 prediction models like BP artificial neural network (BP), partial least squares regressions (PLSR) and principal component regression (PCR) model of sugar content and firmness were built, respectively. The results showed that the sugar content and firmness can be predicted by 3 types of models. The BP model based on feature wavelength achieved the optimal performance for sugar content and firmness. The correlation coefficient and root mean square errors of prediction by BP were 0.9225, 0.137 for SSC and 0.9126, 1.099 for firmness, respectively. The study demonstrated that hyperspectral imaging technique can be a reliable tool to detection of apple internal qualities, which provided a theoretical reference for nondestructive detection of apple.
机译:糖含量和硬度是重要的内部特性,对于质量等级和工业生产具有重要意义。对高光谱成像技术进行了研究,以预测苹果中的糖含量和硬度。从400nm和1000nm之间的图像感兴趣区域提取平均光谱。经过乘法散射校正(MSC)预处理后,使用偏最小二乘(PLS)的回归系数来提取特征波长。提取了6个特征波长的糖含量(384.2、418.9、502.5、675.2、720.9、968.7nm)和6个特征波长的硬度(418.9、500.0、513.5、599.9、704.4、964.7nm)。比较了全波长和特征波长下糖含量和硬度预测模型的性能,使用了3种预测模型,例如BP人工神经网络(BP),偏最小二乘回归(PLSR)和主成分回归(PCR)模型。牢固性分别建立。结果表明,糖含量和硬度可以通过三种类型的模型进行预测。基于特征波长的BP模型在糖含量和硬度方面达到了最佳性能。 BP预测的相关系数和均方根误差对于SSC分别为0.9225、0.137和针对牢固性的0.9126、1.099。研究表明,高光谱成像技术可以作为检测苹果内部品质的可靠工具,为苹果的无损检测提供了理论依据。

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