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DC breakdown voltage tests may not be a good indicator of long-term ageing behaviour: A study of silica — XLPE nanocomposites

机译:直流击穿电压试验可能不是长期老化行为的良好指标:二氧化硅 - XLPE纳米复合材料的研究

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Short-term DC progressive-stress tests on 200 micron thick specimens of a commercial XLPE and its silica nanocomposite intended for DC use have shown that the DC nanocomposite has a considerably higher breakdown strength than the AC XLPE. However, constant-stress tests have shown that both the nanocomposite and the unfilled XLPE have similar lifetimes at medium fields of 125-175 kV/mm. There is also evidence from the Weibull shape parameters that the nanocomposite may be progressively deteriorating at these fields, whereas the unfilled XLPE may show little sign of aging. On the basis of the inverse power law, it is possible that the unfilled materials may survive longer at lower fields: median life exponents of n = 11.3 were found for the nano-composite and n = 14.0 for the XLPE. These values are consistent with estimates from step tests on the same materials that have been recently published. The paper raises questions regarding the long-term DC performance of these nanocomposites, and whether it is reasonable, at least for DC conditions and perhaps for nanocomposites, to judge long-term performance from shortterm testing.
机译:用于DC使用的200微米厚度的200微米厚度标本的短期直流渐进式 - 已经表明,DC纳米复合材料具有比AC XLP的相当高的击穿强度。然而,恒压试验表明,纳米复合材料和未填充的XLPE在125-175kV / mm的中等领域具有类似的寿命。来自Weibull形状参数的证据表明,纳米复合材料可以在这些领域逐渐恶化,而未填充的XLPE可能表现出较小的老化迹象。在逆动力法的基础上,未填充的材料可能在较低的领域中存活更长时间:N = 11.3的中值寿命指数被发现为纳米复合材料,N = 14.0用于XLPE。这些值与最近发布的相同材料上的步骤测试的估计一致。纸张提高了关于这些纳米复合材料的长期直流性能的问题,以及是否合理,至少对于DC条件以及纳米复合材料,可以从短期测试中判断长期性能。

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