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Oxidation mechanism and surface passivation of Germanium by ozone

机译:臭氧对锗的氧化机理和表面钝化

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Oxidation mechanism and passivation of Ge surface by ozone is experimentally investigated. The GeOx oxidation process contains two regions: initial linear growth region and following parabolic growth region. The linear growth region contains reaction of oxygen atoms with surface bond and back bonds of outmost Ge layer. The parabolic growth region starts when the oxygen atoms diffuse into back bonds of second outmost Ge layers. Furthermore, in the ozone oxidation it is not O molecules but O radicals that go through the GeO film. The interface state density (D) is found to decrease with increasing the GeO thickness (0.26-1.06 nm). X-ray photoelectron spectroscopy (XPS) results show that Ge oxide component is responsible to the decrease of D.
机译:通过臭氧进行氧化机理和Ge表面的钝化。实验研究了臭氧。 Geox氧化方法含有两个区域:初始线性生长区域和抛物面生长区域。线性生长区域含有氧原子的反应与最大的GE层的表面键和后键。抛物线生长区域开始,当氧原子漫反射到第二最大的GE层的背粘合时。此外,在臭氧氧化中,它不是O分子,而是通过地质膜的自由基。发现接口状态密度(D)随着Geo厚度(0.26-1.06nm)而降低。 X射线光电子能谱(XPS)结果表明,Ge氧化物组分负责D的降低。

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