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Investigation and comparison of design space for ultra-thin-body GeOI/SOI negative capacitance FETs

机译:超薄GeOI / SOI负电容FET设计空间的研究与比较

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Using the concept of design space, we have investigated and compared the subthreshold characteristics of UTB NCFETs with Ge/Si channel. Our results indicate that high permittivity channel is more suitable for NCFET design because of the high C. Furthermore, as channel length shrinks, the optimal SS of the NCFET becomes smaller due to the drain coupling (C). In other words, GeOI NCFETs can achieve lower SS than the Si counterpart due to their higher C and C.
机译:利用设计空间的概念,我们研究并比较了具有Ge / Si沟道的UTB NCFET的亚阈值特性。我们的结果表明,由于电容C高,因此高介电常数沟道更适合NCFET设计。此外,随着沟道长度的减小,由于漏极耦合(C),NCFET的最佳SS变得更小。换句话说,由于GeOI NCFET的C和C较高,因此可以实现比SS更低的SS。

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