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Dynamic study of the gate of an n-MOS microfluidic transistor for computational microfluidics

机译:用于计算微流体的n-MOS微流体晶体管的栅极动态研究

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This paper reports for the first time the concept of maximum working frequency of the nMOS microfluidic transistor, commenting the importance of this value on the operation of the device for computational microfluidics. The main component of the microfluidic transistors is the gate, that is, the structure where the actuation takes place. For nMOS microfluidic transistors, this part is a microstructure which includes two membranes, namely, a small membrane and large membrane, linked each other by a column. The natural frequencies of the gate have to be known in order to avoid undesired behaviors. In this paper, a numerical dynamic analysis using Finite Element Method is performed in order to obtain the natural frequencies of this kind of structures, and specially the effects of those results in the whole behavior of the nMOS microfluidic transistor. The study is performed using the parameters of a fabricated microfluidic transistor, where the microstructure of the gate was correctly designed using SU-8 as material. The results show the first natural frequencies at about 4.15 kHz. This value is proposed as maximum working frequency of that particular microfluidic transistor.
机译:本文首次报告了nMOS微流控晶体管最大工作频率的概念,并评论了该值对计算微流控器件运行的重要性。微流体晶体管的主要组件是栅极,即致动发生的结构。对于nMOS微流体晶体管,此部分是一个微结构,它包括两个膜,即一个小膜和一个大膜,它们通过一个列相互连接。为了避免不良行为,必须知道门的固有频率。在本文中,使用有限元方法进行了数值动力学分析,以便获得这种结构的固有频率,特别是这些影响对nMOS微流控晶体管的整体性能产生了影响。使用制造的微流体晶体管的参数进行研究,其中使用SU-8作为材料正确设计了栅极的微结构。结果显示出大约4.15 kHz的第一固有频率。建议将该值作为该特定微流体晶体管的最大工作频率。

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