Scanning Probe-based in-situ High Temperature Electrical and Electrochemical Measurements at Atmospheric Pressure

摘要

Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperature electrical and electrochemical studies (up to 700°C) in a conventional AFM setup by employing a combination of a micro-heating stage (MHS) and custom-made all-metal tips. We present the design, fabrication process and characterization of the MHS and the all-metal tip. A temperature dependent impedance measurement on an MHS-integrated half-cell was then successfully demonstrated with a custom-made Pt-Ir tip. Issues and possible room to improve regarding the new approach are also discussed.