A Compact Set of Seeds for LFSR-Based Test Generation from a Fully-Specified Compact Test Set

摘要

This paper describes a procedure that computes a compact set of seeds for LFSR-based test generation using a fully-specified compact test set. The test set provides a target number of seeds that is not constrained by the LFSR. The procedure uses two techniques to produce a compact set of seeds. (1) It attempts to match a seed to a test in the compact test set, but without requiring a perfect match. (2) It drops a fault from consideration only after it is detected by N > 1 different seeds. A set covering procedure is used for selecting a minimal subset of seeds. Experimental results are presented to demonstrate the ability of the procedure to produce compact sets of seeds. The results also show that an LFSR with a larger number of bits allows a smaller number of seeds to be computed. However, a smaller number of LFSR bits is preferred for a larger reduction in the input test data volume.