Validating the transmission-line based material property extraction procedure including surface roughness for multilayer PCBs using simulations

摘要

Accurate frequency-dependent dielectric properties are important for accurate modeling of signal and power integrity problems. One method for extracting dielectric properties from fabricated multilayer printed circuit boards is based on the measured electrical property of fabricated transmission lines, denoted the “Root-omega” method. In this paper, the “Root-omega” method applied to the cases with smooth and rough conductors is validated using simulations. Potential errors in the procedure are discussed.