TID/SEE Tests of the Radiation Hardened DDR2 SDRAM Memory Solution

机译：防辐射DDR2 SDRAM内存解决方案的TID / SEE测试

获取原文

页面导航

摘要
著录项
相似文献
相关主题

摘要

We report on results of TID/SEL/SEU/SEFI tests of a state of the art RH DDR2-SDRAM Memory solution. The hard errors (TID/SEL) verified at die level, and soft errors (SEU/SEFI) verified at system level.

机译：我们报告了最先进的RH DDR2-SDRAM内存解决方案的TID / SEL / SEU / SEFI测试结果。硬错误（TID / SEL）在芯片级验证，软错误（SEU / SEFI）在系统级验证。

著录项

来源
《IEEE Radiation Effects Data Workshop》|2016年|1-4|共4页
会议地点
作者
Pierre-Xiao Wang; Charles Sellier; Pierre Southiratn; Duc Nguyen; Kai Grurmann;
展开▼
作者单位

展开▼
会议组织
原文格式 PDF
正文语种
中图分类
关键词
Error analysis; Single event upsets; Error correction codes; SDRAM; Three-dimensional displays; Radiation effects;

机译：错误分析;单个事件失败;错误校正码; SDRAM;三维显示;辐射效应;

相似文献

外文文献
中文文献
专利

1. Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMs [J] . Ladbury R.L., Berg M.D., Wilcox E.P., IEEE Transactions on Nuclear Science . 2013,第6aPart1期

机译：基于商用FPGA的评估板用于DDR2和DDR3 SDRAM的单事件测试
2. Test setup for reliability studies of DDR2 SDRAM [J] . Versen M., Ernst W., Singh G., Microelectronics & Reliability . 2015,第9a10期

机译：DDR2 SDRAM可靠性研究的测试设置
3. TID-Tolerant Inverter Designs for Radiation-Hardened Digital Systems [J] . Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment . 2020,第Feba21期

机译：防辐射数字系统的耐TID逆变器设计
4. TID/SEE Tests of the Radiation Hardened DDR2 SDRAM Memory Solution [C] . Pierre-Xiao Wang, Charles Sellier, Pierre Southiratn, IEEE Radiation Effects Data Workshop . 2016

机译：TID /请参阅辐射的测试硬化DDR2 SDRAM存储器解决方案
5. Hardness assurance testing and radiation hardening by design techniques for silicon-germanium heterojunction bipolar transistors and digital logic circuits. [D] . Sutton, Akil K. 2009

机译：通过设计技术对硅锗异质结双极晶体管和数字逻辑电路进行硬度保证测试和辐射硬化。
6. Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects [O] . Yuanyuan Xue, Zujun Wang, Wei Chen, 2017

机译：质子辐射对PPD CMOS图像传感器暗信号分布的影响：TID和DDD效应
7. Design and Realisation of DDR2 SDRAM Controller for Image Real-time Processing Based on FPGA [O] . Si-min GUAN, Fan-liang BU, Guang-di LIU 2017

机译：基于FPGA的图像实时处理DDR2 SDRAM控制器的设计与实现
8. SEE and TID extension testing of the Xilinx XQR18V04 4Mbit radiation hardened configuration PROM [R] . Yui, C., Swift, G., Fabula, J., 2002

机译：Xilinx XQR18V04 4mbit辐射硬化配置pROm的sEE和TID扩展测试

TID/SEE Tests of the Radiation Hardened DDR2 SDRAM Memory Solution

摘要

著录项

相似文献

相关主题

期刊订阅