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Verification of a calibration method for digital to analog converters

机译:验证数模转换器的校准方法

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A new calibration method for digital to analog converters (DAC) is verified, measuring a set of chips, each containing a 8 bit current steering DAC with a 5+3 segmented architecture. For a sampling frequency of 500MHz and a bandwidth of 5MHz all tested circuits exhibited, after calibration, a Spurious Free Dynamic Range (SFDR) better than 50dB. For a sampling frequency of 1GHz and a bandwidth of 10MHz, a SFDR better than 40dB resulted for all tested cases. These last results could be explained by a degradation of the digital signal supplied by the FPGA board, which has a maximum reliable clock frequency of 600MHz, and by the influence of the parasitic elements introduced by the PCB traces. In all measured cases an improvement of 2-4dB of the SFDR value has been obtained using the proposed calibration method.
机译:验证了用于数模转换器(DAC)的新校准方法,该方法测量一组芯片,每个芯片包含具有5 + 3分段架构的8位电流控制DAC。对于500MHz的采样频率和5MHz的带宽,所有测试电路在校准后均表现出优于50dB的无杂散动态范围(SFDR)。对于1GHz的采样频率和10MHz的带宽,在所有测试情况下,SFDR均优于40dB。这些最后的结果可以通过FPGA板提供的数字信号的性能下降来解释,该信号具有600MHz的最大可靠时钟频率,以及PCB走线引入的寄生元件的影响。使用所提出的校准方法,在所有测得的情况下,SFDR值均提高了2-4dB。

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