首页> 外文会议>European corrosion congress >In situ grazing incidence x-ray diffraction of sweet corrosion scaling across an X-65 weld
【24h】

In situ grazing incidence x-ray diffraction of sweet corrosion scaling across an X-65 weld

机译:X-65焊缝上原位掠入射的甜腐蚀垢的X射线衍射

获取原文

摘要

Within the oil and gas industry, CO_2-induced (sweet) corrosion of facilities fabricated from carbon steel is a constant threat to structural integrity. On this basis, significant effort continues to be applied to gain insight into this phenomenon. One specific area of activity is weld-joints, as such areas can be highly vulnerable to failure due to locally increased sweet corrosion rates. There, however, remains incomplete understanding of the mechanisms leading to this phenomenon, including detailed knowledge of potentially protective sweet corrosion scales formed on different regions of a weld-joint (base metal/heat affected zone/fusion zone). To gain further insight into these weld-joint scales, we have exploited grazing incidence x-ray diffraction (GIXRD) to identify the phases formed. Most notably, these measurements have been undertaken in situ, i.e. from a submerged sample, employing a custom built electrochemical cell (E-cell); the E-cell can be deaerated, and the solution temperature elevated up to ~ 80°C. Diffractograms were acquired using this E-cell at the XMaS beam line of the ESRF (France) from a X-65 pipeline steel weld-joint immersed in CO_2 saturated salt solution (pH ~ 4, T - 80°C). These data indicate how the scale composition (e.g. formation of siderite and chukanovite) varies across the width of the weld-joint as a function of immersion time.
机译:在石油和天然气工业中,CO_2诱导(甜)腐蚀碳钢制成的设施一直是对结构完整性的威胁。在此基础上,将继续花费大量精力来深入了解这一现象。焊接接头是活动的一个特定领域,因为这种焊接区域由于局部增加的甜腐蚀速率而极易发生故障。但是,对于导致这种现象的机理仍然缺乏完全的了解,包括对在焊接接头的不同区域(母材/热影响区/熔合区)上形成的潜在保护性甜腐蚀垢的详细了解。为了进一步了解这些焊缝鳞片,我们利用掠入射X射线衍射(GIXRD)识别形成的相。最值得注意的是,这些测量是在原地进行的,即使用定制的电化学电池(E-cell)从浸没样品中进行; E-cell可以脱气,溶液温度升高到约80°C。使用该E单元在ESRF(法国)的XMaS光束线上从浸入CO_2饱和盐溶液(pH〜4,T-80°C)中的X-65管线钢焊接接头获得了衍射图。这些数据表明水垢成分(例如菱铁矿和chukanovite的形成)如何在整个焊接接头宽度上随浸入时间而变化。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号