首页> 外国专利> GRAZING INCIDENCE X-RAY FLUORESCENCE SPECTROMETER AND GRAZING INCIDENCE X-RAY FLUORESCENCE ANALYZING METHOD

GRAZING INCIDENCE X-RAY FLUORESCENCE SPECTROMETER AND GRAZING INCIDENCE X-RAY FLUORESCENCE ANALYZING METHOD

机译:掠入射X射线荧光光谱仪及掠入射X射线荧光分析方法

摘要

A grazing incidence X-ray fluorescence spectrometer (1) of the present invention includes: a bent spectroscopic device (4) to monochromate X-rays (3) from an X-ray source (2) and generate an X-ray beam (5) focused on a fixed position (15) on a surface of a sample (S); a slit member (6) disposed between the bent spectroscopic device (4) and the sample (S) and having a linear opening (61); a slit member moving unit (7) to move the slit member (6) in a direction that intersects the X-ray beam (5) passing through the linear opening (61); a glancing angle setting unit (8) to move the slit member (6) by using the slit member moving unit (7), and set a glancing angle (±) of the X-ray beam (5) to a desired angle; and a detector (10) to measure an intensity of fluorescent X-rays (9) from the sample (S) irradiated with the X-ray beam (5).
机译:本发明的掠入射X射线荧光光谱仪(1)包括:弯曲光谱装置(4),以使来自X射线源(2)的X射线(3)单色并产生X射线束(5)。 )聚焦在样品(S)表面的固定位置(15)上;狭缝构件(6),其布置在弯曲光谱装置(4)与样品(S)之间并具有线性开口(61);狭缝构件移动单元(7)使狭缝构件(6)沿与穿过线性开口(61)的X射线束(5)相交的方向移动。掠角设定单元(8),通过使用狭缝构件移动单元(7)来移动狭缝构件(6),并且将X射线束(5)的掠角(±)设置为期望的角度;检测器(10),用于测量来自被X射线束(5)照射的样品(S)的荧光X射线(9)的强度。

著录项

  • 公开/公告号EP3239701B1

    专利类型

  • 公开/公告日2019-05-15

    原文格式PDF

  • 申请/专利权人 RIGAKU CORPORATION;

    申请/专利号EP20150872403

  • 发明设计人 OMOTE KAZUHIKO;YAMADA TAKASHI;

    申请日2015-10-02

  • 分类号G01N23/223;

  • 国家 EP

  • 入库时间 2022-08-21 12:29:32

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