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Dual-polarimetric agricultural change analysis of long baseline TanDEM-X time series data

机译:长基线TanDEM-X时间序列数据的双极化农业变化分析

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The standard TanDEM-X baselines have been designed to optimize the high resolution global Digital Elevation Model (DEM) generation. However, during the Science Phase of the mission longer baselines are available. This allows interferometric measurements with a higher vertical sensitivity, more appropriate for agricultural applications, where the crop heights are too small to be properly detected and analyzed with the standard baselines. This paper evaluates the use of the experimental long baseline TanDEM-X acquisitions for the monitoring of the agricultural changes in dual-pol single-pass interferometric time series.
机译:标准的TanDEM-X基准旨在优化高分辨率全球数字高程模型(DEM)生成。但是,在任务的科学阶段,可以使用更长的基线。这样可以进行具有较高垂直灵敏度的干涉测量,更适合于农业应用,在这些应用中,作物高度太小而无法使用标准基线正确检测和分析。本文评估了使用实验性长基线TanDEM-X采集数据来监测双极化单通干涉时间序列中的农业变化。

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