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Complex dark-field contrast in grating-based x-ray phase contrast imaging

机译:基于光栅的X射线相位对比成像中的复杂暗场对比

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Without assuming that the sub-pixel microstructures of an object to be imaged distribute in space randomly, we investigate the influence of the object's microstructures on grating-based x-ray phase contrast imaging. Our theoretical analysis and 3D computer simulation study based on the paraxial Fresnel-Kirchhoff theory show that the existing dark-field contrast can be generalized into a complex dark-field contrast in a way such that its imaginary part quantifies the effect of the object's sub-pixel microstructures on the phase of intensity oscillations. A method based on the phase-attenuation duality that holds for soft tissues to be imaged at high x-ray energies is proposed to retrieve the imaginary part of the complex dark-field contrast for imaging. In comparison to the existing dark-field contrast, the imaginary part of complex dark-field contrast exhibits significantly stronger selectivity on the shape of the object's sub-pixel microstructures. Thus the x-ray imaging corresponding to the imaginary part of complex dark-field contrast can provide additional and complementary information to that corresponding to the attenuation contrast, phase contrast and the existing dark-field contrast.
机译:在不假设要成像的对象的亚像素微观结构在空间中随机分布的情况下,我们研究了对象的微观结构对基于光栅的X射线相衬成像的影响。我们的理论分析和基于近轴Fresnel-Kirchhoff理论的3D计算机模拟研究表明,现有暗场对比度可以通过某种方式概括为复杂的暗场对比度,从而使虚部量化物体次子的影响。像素微结构上的强度振荡的相位。提出了一种基于相位衰减对偶的方法,该方法适用于要在高X射线能量下成像的软组织,以检索复杂暗场对比度的虚部进行成像。与现有的暗场对比度相比,复杂暗场对比度的虚部在物体的亚像素微结构的形状上表现出明显更强的选择性。因此,对应于复杂暗场对比度的虚部的X射线成像可以为与衰减对比度,相位对比度和现有暗场对比度相对应的信息提供额外的补充信息。

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