Control and Measuring System of a Two-Dimensional Scanning Nanopositioning Stage Based on LabVIEW

摘要

A control and measuring system of two-dimensional nanopositioning stage is designed for the multiple selection and combinations control based on LabVIEW. The signal generator of the system can not only generate the commonly used control signals such as sine, square, triangle and sawtooth waves, but also generate special signals such as trapezoidal wave and step wave with DAQ data acquisition card. The step wave can be triggered by the other signals for the strict timing corresponding relation between X-Y control signals. Finally, the performance of the control system of two-dimensional nanopositioning stage is conducted by the heterodyne interferometer. The results show that the operation of the system is stable and reliable and the noise peak - valley value is superior to 2nm while the stage moving with 6nm step. The system can apply to the field requiring the precise control to the positioning stage in nano-measurement and metrology.