Technology scaling and reliability: Challenges and opportunities

机译：技术规模和可靠性：挑战与机遇

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This paper reviews the challenges in reliability degradation and modeling triggered by the unwavering technology scaling. By an adequate modeling and choice of tools, the challenges can be turn out to opportunities to enhance IPs and products performances through an accurate trade-off with reliability.

机译：本文回顾了技术不断发展所带来的可靠性下降和建模方面的挑战。通过适当的建模和工具选择，可以通过准确地权衡可靠性来提高IP和产品性能的挑战。

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《IEEE International Electron Devices Meeting》|2015年|1-6|共6页
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V. Huard; F. Cacho; X. Federspiel; W. Arfaoui; M. Saliva; D. Angot;
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BTI; ITRS; aged models; microprocessor; reliability; variability;

机译：BTI; ITRS;老化模型;微处理器;可靠性;可变性;

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2. Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM [J] . Meng Chuan Lee, Hin Yong Wong Journal of nanomaterials . 2013,第Pta6期

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3. Technical Solutions to Mitigate Reliability Challenges due to Technology Scaling of Charge Storage NVM [J] . Meng ChuanLee, Hin YongWong Journal of nanomaterials . 2013,第1期

机译：应对电荷存储NVM技术规模带来的可靠性挑战的技术解决方案
4. Technology scaling and reliability: Challenges and opportunities [C] . V. Huard, F. Cacho, X. Federspiel, IEEE International Electron Devices Meeting . 2015

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Technology scaling and reliability: Challenges and opportunities

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