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High current gate drive circuit with high temperature potential for SiC MOSFET module

机译:SiC MOSFET模块的高温电位高电流栅极驱动电路

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With the development of SiC technology, current rating of the latest SiC MOSFET module goes up to 300A and the gate charge becomes higher than 1000nC, which demands a high gating current to drive the power module. To explore the high current and high temperature (HT) potentials of the SiC MOSFET module, a gate driver circuit with high output current and HT capability is developed. In this paper, particular emphasis is placed on the discussion of the output buffer circuits, including the BJT push-pull, CMOS push-pull and the proposed BJT-CMOS hybrid circuits. Commercially available HT components are used in the design and fabrication of the proposed circuit. The design principles of the circuit are investigated by PSpice simulation and room temperature testing first. Then, the HT experimental testing is performed to verify the full capabilities of the design. The HT experimental testing is performed both on a hotplate of 300°C and in a thermal chamber of 175°C.
机译:随着SiC技术的发展,最新的SiC MOSFET模块的额定电流高达300A,栅极电荷变得高于1000nC,这需要高的门控电流来驱动功率模块。为了探索SiC MOSFET模块的高电流和高温(HT)电位,开发了具有高输出电流和HT能力的栅极驱动器电路。在本文中,将重点放在输出缓冲电路的讨论上,包括BJT推挽,CMOS推挽和拟议的BJT-CMOS混合电路。可商购的HT组件被用于所设计电路的设计和制造中。首先通过PSpice仿真和室温测试来研究电路的设计原理。然后,执行HT实验测试以验证设计的全部功能。 HT实验测试是在300°C的加热板上和175°C的加热室内进行的。

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