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3D vertical RRAM architecture and operation algorithms with effective IR-drop suppressing and anti-disturbance

机译:具有有效的IR压降抑制和抗干扰功能的3D垂直RRAM架构和运算算法

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We propose co-optimization of VRRAM cell structure and array architecture as well as IR-drop-aware read/write algorithms to overcome issues of disturbance and IR drop from long wire. A bi-directional diode (2D) access device is combined with one resistor to form 2D1R cell. A dummy reference plane is inserted into array to set up the same IR drop path of reference cell with that of selected cell. Consequently, the same IR drop effect can be cancelled during read. The model for disturbance analysis is put forward. Voltage dropped on un-selected bit lines is the key parameter to suppress set disturbance. Set disturbance is significantly suppressed even when number of RRAM layers increases to 64. Set voltage has to meet corresponding requirements in order to minimize the disturbance risk.
机译:我们提出共同优化VRRAM单元结构和阵列架构以及可识别IR-drop的读/写算法,以克服长线干扰和IR下降的问题。双向二极管(2D)访问设备与一个电阻器组合形成2D1R单元。将虚拟参考平面插入阵列中,以建立参考单元与所选单元的参考下降路径相同的IR下降路径。因此,在读取期间可以消除相同的IR下降效果。提出了扰动分析模型。未选择的位线上的电压降是抑制设置干扰的关键参数。即使RRAM层数增加到64,也会显着抑制设置干扰。设置电压必须满足相应的要求,以最大程度地降低干扰风险。

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