RF solution with pingpong test mode

摘要

Low cost of test solution is always been pursued and challenged in semiconductor industry as the cost becomes more and more sensitive in current competitive market. This paper shows a new test method for RF devices with short test time, which features one RF ATE (Automatic Test Equipment) working with 2 turret handlers in parallel. The throughput for the similar RF devices is almost double of the normal mode (one RF tester and one handler). One RF tester can be saved for the RF devices. That will definitely reduce the total COT (cost of test) for some RF product testing.