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Role of the grain orientation spread in the pitting corrosion resistance of duplex stainless steels

机译:晶粒取向分布在双相不锈钢抗点蚀性能中的作用

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Duplex Stainless Steels (DSS) are highly important engineering materials due to their generally high corrosion resistance combined with high strength and moderate alloy cost (lower nickel and molybdenum content) compared to standard austenitic grades. They are widely used in various industrial sectors, such as oil & gas (pipes and storage tanks), desalination (evaporators and pumps) and pulp and paper (digester and bleaching reactors) industries. In this paper, the influence of the Grain Orientation Spread (GOS) on the corrosion resistance of DSS was investigated in sodium chloride solution. Corrosion measurements were carried out at the microscale by combining the Critical Pitting Temperature (CPT) method, the electrochemical microcell technique and a Peltier heating microstage (temperature range from -20 to 120°C ie -4 to 248℉ ). Sites were previously selected according to their GOS value. This value was calculated from the crystallographic orientation map derived from Electron Backscatter Diffraction (EBSD) measurements. The GOS gives a quantitative description of the crystallographic orientation gradients in individual grains. CPT measurements were carried out in various sites at the specimen surface: in austenite grains, in ferrite grains, at the austenite/ferrite interface with a ratio of 50/50 and in austenite grains containing extremely small ferrite grains. It has been shown that extremely small ferrite grains with a GOS value greater than 1.3°were systematically precursor sit es for pitting. The CPT range was 45-90°C (113-194℉). It was also found that other grains remaine d passive up to 100°C (212℉).
机译:与标准奥氏体钢种相比,双相不锈钢(DSS)通常具有很高的耐腐蚀性,高强度和适中的合金成本(较低的镍和钼含量),因此是非常重要的工程材料。它们被广泛用于各种工业领域,例如石油和天然气(管道和储罐),脱盐(蒸发器和泵)以及纸浆和造纸(消化器和漂白反应器)行业。本文研究了在氯化钠溶液中晶粒取向扩散(GOS)对DSS耐蚀性的影响。腐蚀测量是通过结合临界点蚀温度(CPT)方法,电化学微电池技术和珀耳帖加热微台(温度范围为-20至120°C,即-4至248℃)在微米级进行的。先前已根据其GOS值选择了站点。该值是根据电子背向散射衍射(EBSD)测量得出的晶体取向图计算得出的。 GOS给出了单个晶粒中晶体取向梯度的定量描述。 CPT测量在试样表面的不同位置进行:奥氏体晶粒,铁素体晶粒,奥氏体/铁素体界面以50/50的比例以及奥氏体晶粒中铁素体晶粒非常小。已经显示,GOS值大于1.3°的极小的铁素体晶粒被系统地点蚀。 CPT范围是45-90℃(113-194℉)。还发现在100°C(212℉)时,其他晶粒仍保持被动状态。

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