首页> 外文会议>Conference on smart Photonic and Optoelectronic Integrated Circuits XVI >Precision alignment of integrated optics in surface electrode ion traps for quantum information processing
【24h】

Precision alignment of integrated optics in surface electrode ion traps for quantum information processing

机译:表面电极离子阱中集成光学器件的精确对准,用于量子信息处理

获取原文

摘要

The integration of optics for efficient light delivery and the collection of fluorescence from trapped ions in surface electrode ion traps is a key component to achieving scalability for quantum information processing. Diffractive optical elements (DOEs) present a promising approach as compared to bulk optics because of their small physical profile and their flexibility in tailoring the optical wavefront. The precise alignment of the optics for coupling fluorescence to and from the ions, however, poses a particular challenge. Excitation and manipulation of the ions requires a high degree of optical access, significantly restricting the area available for mounting components. The ion traps, DOEs, and other components are compact, constraining the manipulation of various elements. For efficient fluorescence collection from the ions the DOE must be have a large numerical aperture (NA), which results in greater sensitivity to misalignment. The ion traps are sensitive devices, a mechanical approach to alignment such as contacting the trap and using precision motors to back-off a set distance not only cannot achieve the desired alignment precision, but risks damage to the ion trap. We have developed a non-contact precision optical alignment technique. We use line foci produced by off-axis linear Fresnel zone plates (FZPs) projected on alignment targets etched in the top metal layer of the ion trap and demonstrate micron-level alignment accuracy.
机译:集成光学器件以实现有效的光传输,以及从表面电极离子阱中捕获的离子中收集荧光,是实现量子信息处理可扩展性的关键组成部分。与体光学相比,衍射光学元件(DOE)提出了一种有前途的方法,因为它们的物理外形较小,并且在定制光学波前时具有灵活性。然而,用于将荧光耦合到离子和从离子耦合的光学器件的精确对准提出了特别的挑战。离子的激发和操纵需要高度的光学通道,大大限制了可用于安装组件的区域。离子阱,DOE和其他组件非常紧凑,从而限制了各种元素的操纵。为了从离子中有效收集荧光,DOE必须具有较大的数值孔径(NA),这会导致对未对准的敏感性更高。离子阱是灵敏的设备,用于对准的机械方法(例如接触离子阱并使用精密电机补偿一定距离)不仅不能达到所需的对准精度,而且有损坏离子阱的风险。我们已经开发了一种非接触式精密光学对准技术。我们使用由离轴线性菲涅耳波带片(FZPs)产生的线焦点,该线焦点投射在离子阱的顶部金属层中蚀刻的对准目标上,并显示出微米级的对准精度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号