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Development of low temperature amorphous tin-doped indium oxide thin-film transistors technology

机译:低温非晶掺杂锡的氧化铟薄膜晶体管技术的发展

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We successfully fabricated high performance amorphous tin-doped indium oxide (a-ITO) thin film transistors (TFTs) at low temperature (≤ 150 °C) for full-transparent, flexible and large area electronics applications. The fabricated a-ITO TFT has a typical threshold voltage (Vth) of about 0.12 V, an acceptable carrier mobility of 7.6 cm/V·s, and a steep subthreshold swing of 174 mV/decade. The on/off current ratio is more than 1×10.
机译:我们成功地在低温(≤150°C)下制造了用于全透明,柔性和大面积电子应用的高性能非晶态掺杂锡的氧化铟(a-ITO)薄膜晶体管(TFT)。制成的a-ITO TFT具有典型的阈值电压(Vth)约为0.12 V,可接受的载流子迁移率为7.6 cm / V·s,陡峭的亚阈值摆幅为174 mV /十倍。开/关电流比大于1×10。

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