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Switching Losses Mechanisms of Unipolar Devices with Large Parasitic Capacitances

机译:具有大寄生电容的单极器件的开关损耗机制

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This paper analyses the switching losses of the power semiconductors of a half bridge with inductive load. The focus is on unipolar power semiconductors with large output capacitances such as a SiC-FET and its body-diode or a Schottky-Barrier-Diode. The losses of the devices will be divided into dissipated energy and stored energy. With the switching off is some of the measured energy stored and the other dissipated. The dissipated energy during switching on is the stored energy and the measured. The exact amount of switching losses can be measured but each one is inaccurate. The diode shows the same phenomena. So a Schottky-Barrier-Diode may not have switching losses.
机译:本文分析了具有感性负载的半桥功率半导体的开关损耗。重点是具有大输出电容的单极功率半导体,例如SiC-FET及其体二极管或肖特基势垒二极管。器件的损耗将分为耗散能量和存储能量。关闭电源后,会存储一些已测量的能量,而其他能量则会消散。接通期间的耗散能量是存储的能量和测量值。可以测量出准确的开关损耗量,但每一个都不准确。二极管显示出相同的现象。因此,肖特基势垒二极管可能没有开关损耗。

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