首页> 外文会议>CPES annual power electronics conference >Avoiding Si MOSFET avalanche and Achieving Zero-Voltage-Switching for Cascode Devices
【24h】

Avoiding Si MOSFET avalanche and Achieving Zero-Voltage-Switching for Cascode Devices

机译:避免Si MOSFET雪崩并实现Cascode器件的零电压开关

获取原文

摘要

The cascode structure is widely used for high voltagenormally on wide band gap devices. However the interactionbetween the high voltage normally on device and low voltagenormally off Si MOSFET may induce undesired features. Thispaper analyzes the voltage distribution principle during turn offtransition as well as zero-voltage-switching (ZVS) principleduring turn on transition for cascode devices. The capacitancemismatch between high voltage normally on device and lowvoltage Si MOSFET causes Si MOSFET avalanche and highvoltage device internal lose ZVS condition. This issue must besolved both for power loss and reliability consideration. A simpleeffective solution is proposed by adding an extra capacitor tocompensate the capacitance mismatch and avoid Si MOSFETavalanche and achieve true ZVS for cascode devices. The benefitsand small penalty are analyzed in detail. The theoretical analysisis validated by experiments which is implemented based on 600Vcascode GaN device. The experiment shows that the proposedmethod improves the 600V cascode GaN devices performancesignificantly in high frequency application.
机译:共源共栅结构广泛用于高压 通常在宽带隙设备上。但是互动 在设备正常高压和低压之间 通常情况下,关断的MOSFET可能会引起不良的功能。这 分析了关断时的电压分配原理 过渡以及零电压开关(ZVS)原理 在级联设备的开启过渡期间。电容值 正常情况下设备上的高电压与低电压之间的不匹配 电压Si MOSFET导致Si MOSFET雪崩和高 电压设备内部丢失ZVS条件。这个问题一定是 解决了功率损耗和可靠性方面的问题。一个简单的 通过添加一个额外的电容器来提出有效的解决方案 补偿电容失配并避免使用Si MOSFET 并为级联设备实现真正的ZVS。好处 和小罚款的详细分析。理论分析 通过基于600V的实验验证 共源共栅GaN器件。实验表明,提出的 方法提高了600V级联GaN器件的性能 在高频应用中具有重要意义。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号