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Characterization of a γ-Ray Detection System Based on a CsI(Tl) Scintillator Coupled to a Silicon PiN Diode

机译:基于CSI(TL)闪烁体耦合到硅引脚二极管的γ射线检测系统的表征

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摘要

As a step towards the realization of a γ-ray 8×8 modular imaging probe, the single pixel element has been extensively tested. It consists of a 6.1 mm~2 × 3.7 mm CsI(Tl) scintillation crystal optically coupled to the backside of a 3.6 mm~2 PiN diode on a 300μm fully depleted silicon wafer. The γ-ray detection system has been irradiated with the radio-isotopes: ~(241)Am, ~(99m)Tc, ~(152)Eu and ~(137)Cs to span the energy range between 60 and 1400 keV. The linearity of the response is very good and the total conversion efficiency is 0.45. The dependence of the energy resolution on the electronic noise has been simulated and compared with experimental values. The intrinsic resolution of the crystal is about 6% and the ENC about 200 rms electrons. The resolution on the 140 keV line of the ~(99m)Tc and the 660 keV line of the ~(137)Cs are 19% and 7.4%, respectively.
机译:作为实现γ射线8×8模块化成像探针的步骤,单像素元件已被广泛地测试。它由6.1 mm〜2×3.7 mm的CSI(TL)闪烁晶体光学耦合到3.6mm〜2引脚二极管的背面,在300μm完全耗尽的硅晶片上。 γ射线检测系统已用无线电同位素照射:〜(241)AM,〜(99m)Tc,〜(152)欧盟和〜(137)CS跨越60和1400kev之间的能量范围。响应的线性非常好,总转换效率为0.45。能量分辨率对电子噪声的依赖性已经模拟并与实验值进行了比较。晶体的固有分辨率约为6%,ENC约200 rms电子。 〜(99m)Tc的140keV线和〜(137)Cs的660keV线的分辨率分别为19%和7.4%。

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